Anritsu MD6420A 數(shù)字傳輸分析儀
MD6420A 是一款臺(tái)式數(shù)據(jù)網(wǎng)絡(luò)比特誤碼率測(cè)試儀適于
數(shù)字?jǐn)?shù)據(jù)網(wǎng)絡(luò)質(zhì)量的評(píng)價(jià)其主要功能和MD6430A 基本
相同其主要特點(diǎn)是可以測(cè)試各種數(shù)據(jù)通信設(shè)備從低
速M(fèi)ODEM 到高速的數(shù)字租用線速率50bps 到
10Mbps 支持V/X/G/I 系列接口的測(cè)試擁有豐富的測(cè)
試模塊提供G.821 的誤碼性能分析標(biāo)準(zhǔn)有圖形化分
析功能有內(nèi)置打印機(jī)操作簡(jiǎn)單方便
Bit error rate measurement is the most critical parameter in evaluating the quality of digital transmission modes. However, conventional methods, which measure only average bit error rates, are inadequate. In the MD6420A, various types of extension and remote control units are provided as options, as well as units which allow the use of various types of interfaces.
MD6420A 是一款臺(tái)式數(shù)據(jù)網(wǎng)絡(luò)比特誤碼率測(cè)試儀適于
數(shù)字?jǐn)?shù)據(jù)網(wǎng)絡(luò)質(zhì)量的評(píng)價(jià)其主要功能和MD6430A 基本
相同其主要特點(diǎn)是可以測(cè)試各種數(shù)據(jù)通信設(shè)備從低
速M(fèi)ODEM 到高速的數(shù)字租用線速率50bps 到
10Mbps 支持V/X/G/I 系列接口的測(cè)試擁有豐富的測(cè)
試模塊提供G.821 的誤碼性能分析標(biāo)準(zhǔn)有圖形化分
析功能有內(nèi)置打印機(jī)操作簡(jiǎn)單方便
Bit error rate measurement is the most critical parameter in evaluating the quality of digital transmission modes. However, conventional methods, which measure only average bit error rates, are inadequate. In the MD6420A, various types of extension and remote control units are provided as options, as well as units which allow the use of various types of interfaces.
The measuring conditions can be stored in memory and recalled prior to measurement with the touch of a single key. An error analysis function allows histograms of either error or alarm data to be quickly and easily displayed. In addition, the analyzer is portable so that it can be used on site for maintenance operations.
Features:
Can measure a variety of devices from low-speed modems to high speed digital lines
Can be configured to a variety of communications protocols via ITU-T V, X, G, and I series by using plug-in units. Can perform high quality evaluations of data communications systems that have bit rates from 50 b/s to 10 Mb/s.
- Simultaneous error measurement of various error parameters
The error count (bit error, parity error, and CRC error, etc.) error rate, block error count, block error rate, US, %US, SES, %SES, DM, %DM, ES, %ES, EFS, %EFS, AT, %AT, BBER, clock slip, and synchronization loss can be measured, Alarm states such as AIS can be continuously monitored *.
*Conforms to ITU-T G.821 - Data will not be lost if a power failure occurs during measurement
If an AC power failure occurs during error rate measurements, all data obtained prior to the failure is recalled from memory and the measurement is automatically continued when the power is resupplied. When the power returns, the time at which power failure occurred is displayed on the EL display. - Storage and statistical analysis of error measurement data
When a error analysis unit is used, the error measurement data can be stored in the unit. The results of stored data analyses can be displayed as a histogram.
